Download PDFOpen PDF in browserCurrent versionWafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer VariantEasyChair Preprint 15192, version 15 pages•Date: October 4, 2024AbstractWe utilized a denoising technique, a flexible input-size model, and a new training strategy to detect latent defects based on neighboring information. This approach reduced DPPM (defective parts per million) by 24% Keyphrases: Defective parts per million (DPPM), Geographical part average testing (GPAT), Good-die-in-bad-neighborhood (GDBN), Latent defect, neural network
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